PCB thin-film metrology for process control and incoming inspection has unique requirements – many small measurement features over very large areas in a short amount of time. To meet these demands Fischer Technology has developed a line of application specific X-Ray Fluorescence (XRF) instruments. No matter the size of your boards or your pads, Fischer has the thin-film metrology solution.
Brands: FISCHERSCOPE® X-RAYs: XDAL®, XDL®, XDLM®, XDV®, XUL®, XULM®, XUV®. MMS® PC2 modules: PERMASCOPE®, BETASCOPE®, SIGMASCOPE®, PHASCOPE®, NICKELSCOPE®, SR-SCOPE®. PICODENTOR® Nanoindentation tester